• DocumentCode
    2519854
  • Title

    Linearizing ideal A/D converters via analog and digital dither: Analytical study

  • Author

    Wagdy, Mahmoud Fawzy ; Goff, Michael

  • Author_Institution
    Dept. of Electr. Eng., California State Univ., Long Beach, CA, USA
  • fYear
    1993
  • fDate
    18-20 May 1993
  • Firstpage
    154
  • Lastpage
    162
  • Abstract
    This study is a continuation of previous work by M. F. Wagdy (1989). The authors further investigate the effect of various dither forms, i.e., with different probability density functions (PDFs), on the average observed transfer characteristics of ideal A/D converters (ADCs). The effect of analog dither on the averaged transfer characteristics is illustrated. Different dither forms are considered: rectangular, triangular, and Gaussian. The deviation of the ADC characteristics from the ideal straight line is evaluated for these dither forms using the concept of nonlinearity spectra developed earlier. Results are also compared with simulations based on the mean square error criterion. Two cases of digital dither are investigated: one with a rectangular envelope and the other with a triangular envelope. Effects of dither peak-to-peak values and number of PDF impulses are investigated. A quantitative basis is provided for replacing analog dither with the easier to implement digital dither
  • Keywords
    analogue-digital conversion; digital simulation; linearisation techniques; probability; signal processing; Gaussian dither; analog dither; average observed transfer characteristics; digital dither; dither peak-to-peak values; ideal A/D converters; mean square error criterion; nonlinearity spectra; probability density functions; rectangular dither; rectangular envelope; triangular dither; triangular envelope; Analog-digital conversion; Analytical models; Character generation; Computer simulation; Convolution; Linearity; Quantization; Random number generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1993. IMTC/93. Conference Record., IEEE
  • Conference_Location
    Irvine, CA
  • Print_ISBN
    0-7803-1229-5
  • Type

    conf

  • DOI
    10.1109/IMTC.1993.382660
  • Filename
    382660