Title :
A monolithic six-port module for built-in-test applications
Author :
Solomon, Moise N. ; McClay, C. Phillip ; Cronson, Harry M. ; Chu, Alejandro ; Weitzman, Peter S.
Author_Institution :
MITRE Corp., Bedford, MA, USA
Abstract :
A fully monolithic six-port module is described. It includes a six-port junction, matched FET diode detectors, logarithmic amplifiers, and tunable Gunn-effect oscillators on a 3-mm × 3-mm GaAs die. On-chip temperature compensation of the detectors results in improved measurement reproducibility and increased dynamic range. In a reflectometer configuration, the monolithic six-port module (MSPM) demonstrates good agreement with National Institute of Standards and Technology (NIST) measurements on the same components. A built-in-test (BIT) demonstration of the MSPM allows the measurement of incident and reflected signals in an antenna feed while coupling less than 0.7% of the system power into the MSPM
Keywords :
III-V semiconductors; antenna feeds; antenna testing; built-in self test; compensation; gallium arsenide; measurement standards; microwave measurement; monolithic integrated circuits; multiport networks; 3 mm; BIT; GaAs die; NIST; antenna feed; built-in-test; built-in-test applications; coupling; dynamic range; incident signals; logarithmic amplifiers; matched FET diode detectors; monolithic six-port module; reflected signals; reproducibility; six-port junction; temperature compensation; tunable Gunn-effect oscillators; Antenna measurements; Dynamic range; Envelope detectors; FETs; Gallium arsenide; NIST; Oscillators; Power measurement; Reproducibility of results; Temperature distribution;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1993. IMTC/93. Conference Record., IEEE
Conference_Location :
Irvine, CA
Print_ISBN :
0-7803-1229-5
DOI :
10.1109/IMTC.1993.382667