DocumentCode
2519987
Title
Diffusion of copper into gold plating
Author
Pucic, Sunchana P.
Author_Institution
NIST, Boulder, CO, USA
fYear
1993
fDate
18-20 May 1993
Firstpage
114
Lastpage
117
Abstract
The value of the room-temperature copper-gold interdiffusion coefficient derived by extrapolating from high-temperature measurements is an underestimate by several orders of magnitude. Plating copper with a gold film has several disadvantages. Two specimens were analyzed by using Auger electron spectroscopy. Once the full thickness of the gold film is penetrated, copper accumulates on the surface, and a layer of high concentration of copper exists immediately below the gold-air interface. Electrical resistivity of an alloy is much higher than the resistivity of either component. This high-resistivity layer may be localized within the skin depth of propagating electromagnetic waves; in cases where copper has reached the surface, it is permanently within the skin depth at any frequency. A nickel diffusion barrier, commonly applied between copper and gold, is unsuitable in many microwave and millimeter-wave applications because of ferromagnetism of nickel at room temperature. The compound that forms on the surface of untreated copper at room temperature in a reasonably clean atmosphere is cuprous oxide. Its properties make it a better alternative to gold in microwave and millimeter-wave engineering
Keywords
Auger effect; chemical interdiffusion; copper; electrical resistivity; electron spectroscopy; electroplating; gold; skin effect; Auger electron spectroscopy; Cu-Au; Cu2O; Ni diffusion; clean atmosphere; electrical resistivity; ferromagnetism; high-temperature measurements; interdiffusion coefficient; microwave; millimeter-wave applications; room temperature; skin depth; Conductivity; Copper; Electric resistance; Electromagnetic propagation; Electrons; Gold; Nickel; Skin; Spectroscopy; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1993. IMTC/93. Conference Record., IEEE
Conference_Location
Irvine, CA
Print_ISBN
0-7803-1229-5
Type
conf
DOI
10.1109/IMTC.1993.382669
Filename
382669
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