• DocumentCode
    2520046
  • Title

    Analysis and experiment of HBAR frequency spectra and applications to characterize the piezoelectric thin film and to HBAR design

  • Author

    Pao, Shih-Yung ; Chao, Min-Chiang ; Wang, Zuoqing ; Chiu, Chh-Hung ; Lan, Kung-Chih ; Huang, Zi-Neng ; Shih, Lung-Rung ; Wang, Chi-Lin

  • Author_Institution
    TXC Corp., Taoyuan, Taiwan
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    27
  • Lastpage
    35
  • Abstract
    In this paper, we present the resonance frequency spectra features of a composite resonator consisting of a piezoelectric film and a substrate plate. Based on those features, a direct method to characterize the piezoelectric film with two electrodes is presented. By directly using the parallel and series resonant frequency spectra of the HBAR, the electromechanical coupling factor, the density and the elastic constant of the piezoelectric film can be obtained directly. Some problems related to the accuracy of the method, especially the effect of the electrodes, are discussed.
  • Keywords
    acoustic resonators; bulk acoustic wave devices; crystal resonators; piezoelectric thin films; HBAR design; HBAR frequency spectra; electrode effects; electromechanical coupling factor; parallel resonant frequency spectra; piezoelectric film density; piezoelectric film elastic constant; piezoelectric film/substrate plate composite resonator; piezoelectric thin film characterization; resonance frequency spectra; series resonant frequency spectra; Acoustic measurements; Chaos; Electrodes; Frequency measurement; Impedance; Numerical simulation; Piezoelectric films; Resonance; Resonant frequency; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium and PDA Exhibition, 2002. IEEE International
  • Print_ISBN
    0-7803-7082-1
  • Type

    conf

  • DOI
    10.1109/FREQ.2002.1075851
  • Filename
    1075851