• DocumentCode
    2520111
  • Title

    The Superior Drop Test Performance of SAC-Ti Solders and Its Mechanism

  • Author

    Liu, Weiping ; Bachorik, Paul ; Lee, Ning-Cheng

  • Author_Institution
    Indium Corp. of America, Utica, NY, USA
  • fYear
    2008
  • fDate
    9-12 Dec. 2008
  • Firstpage
    1046
  • Lastpage
    1053
  • Abstract
    SAC-Ti alloys exhibited significantly improved drop test performance over not only SAC alloys, but also 63Sn37Pb for ENIG/OSP, NiAu/OSP, and OSP/OSP surface finish systems. The superior performance is attributed to (1) the increased grain size and dendrite size, therefore reduced hardness of solder, (2) inclusion of Ti in the IMC layer, and (3) reduced IMC layer thickness. DSC data indicate that the melting temperature and range were not affected by Ti, but the undercooling was almost completely suppressed. The creep properties of SAC-Ti alloy were comparable with those of SAC alloy, strongly suggesting the gain in drop test performance was not achieved by compromising the thermal fatigue performance. SAC-Mn alloys were also found to outperform SAC alloys and Sn63 for the X/OSP finish combinations studied. In general, SAC-Ti performed equally to or better than SAC-Mn alloys.
  • Keywords
    ball grid arrays; copper alloys; creep; dendrites; dendritic structure; differential scanning calorimetry; gold; gold alloys; grain size; hardness; materials testing; mechanical testing; melting; nickel; nickel alloys; silver alloys; solders; thermal stress cracking; tin alloys; titanium alloys; undercooling; BGA system; DSC; ENIG-OSP surface finish; IMC layer; NiAu-OSP surface finish; SAC-Ti solder; SnAgCuTi-Ni-Au; SnAgCuTi-NiAu; creep; dendrite size; drop test; grain size; hardness; melting temperature; thermal fatigue; undercooling; Assembly; Environmentally friendly manufacturing techniques; Fatigue; Indium; Lead; Soldering; Steel; Surface finishing; System testing; Titanium alloys; SAC; Solder; drop test; fragility; lead-free; tin-silver-copper;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2008. EPTC 2008. 10th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-2117-6
  • Electronic_ISBN
    978-1-4244-2118-3
  • Type

    conf

  • DOI
    10.1109/EPTC.2008.4763568
  • Filename
    4763568