Title :
The Superior Drop Test Performance of SAC-Ti Solders and Its Mechanism
Author :
Liu, Weiping ; Bachorik, Paul ; Lee, Ning-Cheng
Author_Institution :
Indium Corp. of America, Utica, NY, USA
Abstract :
SAC-Ti alloys exhibited significantly improved drop test performance over not only SAC alloys, but also 63Sn37Pb for ENIG/OSP, NiAu/OSP, and OSP/OSP surface finish systems. The superior performance is attributed to (1) the increased grain size and dendrite size, therefore reduced hardness of solder, (2) inclusion of Ti in the IMC layer, and (3) reduced IMC layer thickness. DSC data indicate that the melting temperature and range were not affected by Ti, but the undercooling was almost completely suppressed. The creep properties of SAC-Ti alloy were comparable with those of SAC alloy, strongly suggesting the gain in drop test performance was not achieved by compromising the thermal fatigue performance. SAC-Mn alloys were also found to outperform SAC alloys and Sn63 for the X/OSP finish combinations studied. In general, SAC-Ti performed equally to or better than SAC-Mn alloys.
Keywords :
ball grid arrays; copper alloys; creep; dendrites; dendritic structure; differential scanning calorimetry; gold; gold alloys; grain size; hardness; materials testing; mechanical testing; melting; nickel; nickel alloys; silver alloys; solders; thermal stress cracking; tin alloys; titanium alloys; undercooling; BGA system; DSC; ENIG-OSP surface finish; IMC layer; NiAu-OSP surface finish; SAC-Ti solder; SnAgCuTi-Ni-Au; SnAgCuTi-NiAu; creep; dendrite size; drop test; grain size; hardness; melting temperature; thermal fatigue; undercooling; Assembly; Environmentally friendly manufacturing techniques; Fatigue; Indium; Lead; Soldering; Steel; Surface finishing; System testing; Titanium alloys; SAC; Solder; drop test; fragility; lead-free; tin-silver-copper;
Conference_Titel :
Electronics Packaging Technology Conference, 2008. EPTC 2008. 10th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2117-6
Electronic_ISBN :
978-1-4244-2118-3
DOI :
10.1109/EPTC.2008.4763568