DocumentCode :
2520228
Title :
Applying the IEEE-1057 draft standard to calibration of equivalent-time sampling oscilloscopes
Author :
Young, Robert W.
Author_Institution :
PC Instruments, Inc., Twinsburg, OH, USA
fYear :
1993
fDate :
18-20 May 1993
Firstpage :
43
Lastpage :
46
Abstract :
The author presents a methodology for calibrating an equivalent-time sampling oscilloscope using some techniques from the IEEE Standard for Digitizing Waveform Recorders (IEEE-1057). The standard was designed with real-time waveform recorders in mind. Equivalent-time waveform recorders present additional difficulties in time-base calibration. Because each sample is delayed slightly from those before it, careful calibration of the time-base delay generator is necessary. A general algorithm for calibrating vertical, time-base, and trigger subsystems is presented. Special attention is paid to the calibration of the time-base of an equivalent-time sampling oscilloscope. Complications arise when calibrating an equivalent-time sampling oscilloscope with a variable time-base. Nonlinearities in the time-base and its wide operating range can produce a complex calibration curve. Judicious application of sine wave curve fitting, frequency estimation, zero-finding, and local minimum-finding techniques can minimize the need for prior knowledge of the calibration curve
Keywords :
IEEE standards; analogue-digital conversion; calibration; computerised instrumentation; curve fitting; measurement standards; oscilloscopes; time bases; wave analysers; waveform analysis; Digitizing Waveform Recorders; IEEE-1057; IEEE-1057 draft standard; calibration; equivalent-time sampling oscilloscopes; frequency estimation; local minimum-finding; nonlinearities; real-time waveform recorders; sine wave curve fitting; time-base; trigger subsystems; vertical subsystem; zero-finding; Amplitude estimation; Calibration; Circuit testing; Data acquisition; Delay; Discrete Fourier transforms; Equations; Instruments; Oscilloscopes; Sampling methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1993. IMTC/93. Conference Record., IEEE
Conference_Location :
Irvine, CA
Print_ISBN :
0-7803-1229-5
Type :
conf
DOI :
10.1109/IMTC.1993.382684
Filename :
382684
Link To Document :
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