Title :
Statistical analysis for the oscillation frequency of a ring oscillator
Author :
Zhu, Wanjing ; Lu, Tan ; Zhu, Weijie ; Ma, Jianguo
Author_Institution :
Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
It is important to find the statistical characteristics of the ring oscillators in mass production but the computational complexity prevents us from finding the distribution of these characteristics. Consequently, predicting the statistical parameters of these characteristics is much more practical. This paper derives the mathematical relationship between the variation of the capacitances and the process variations. And the Monte Carlo Method is used to build three linear prediction equations for the variation of oscillation frequency.
Keywords :
Monte Carlo methods; capacitance; computational complexity; mass production; oscillators; statistical analysis; Monte Carlo method; capacitances; computational complexity; linear prediction equations; mass production; oscillation frequency; process variations; ring oscillator; statistical analysis; statistical characteristics; statistical parameters; Capacitance; Logic gates; Monte-Carlo Method; Process Variation; Ring Oscillator; Statistical Analysis;
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2010 IEEE International Conference of
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-9997-7
DOI :
10.1109/EDSSC.2010.5713684
