Title :
Modeling the effect of NMOS gate capacitance in an on-chip decoupling capacitor PAA countermeasure
Author :
Mayhew, Matthew ; Muresan, Radu
Author_Institution :
Sch. of Eng., Univ. of Guelph, Guelph, ON, Canada
Abstract :
In this paper we develop a general model based on the width of a decoupling NMOS gate capacitor for use in the design of decoupling based Power Analysis Attack (PAA) countermeasures. A polynomial equation was determined based on experimental data to link the width of the decoupling element with the data security provided by the countermeasure architecture. The proposed model is meant to act as a tool for a designer when considering the incurred design overheads when allocating area during the initial planning phase. Experimental data was collected from the simulation of a partial decoupling countermeasure test bench implemented in 65 nm TSMC technology with Correlation Power Analysis (CPA) attacks performed on traces collected at the power supply pin.
Keywords :
MOSFET; capacitors; polynomials; semiconductor device models; CPA; NMOS gate capacitance effect modelling; TSMC technology; correlation power analysis attack; countermeasure architecture; data security; decoupling based power analysis attack countermeasure design; design overheads; on-chip decoupling capacitor PAA countermeasure; partial decoupling countermeasure test bench; planning phase; polynomial equation; power supply pin; size 65 nm; Capacitors; Computer architecture; Data security; Logic gates; MOS devices; Power supplies; CPA; PAA; data security; decoupling; side-channel attacks;
Conference_Titel :
Circuits and Systems (MWSCAS), 2014 IEEE 57th International Midwest Symposium on
Conference_Location :
College Station, TX
Print_ISBN :
978-1-4799-4134-6
DOI :
10.1109/MWSCAS.2014.6908367