Title :
Noise properties of cryogenic microwave amplifiers and relevance to oscillator frequency stabilization
Author :
Ivanov, Eugene ; Parker, Stefan ; Bara-Maillet, Romain ; Tobar, Michael
Author_Institution :
Sch. of Phys., Univ. of Western Australia, Crawley, WA, Australia
Abstract :
We studied noise properties of a new generation of energy-efficient microwave low-noise high-electron-mobility-transistor amplifiers. The noise measurements were conducted both at room and cryogenic temperature with the amplifiers strongly decoupled from the environment to reduce the influence of ambient temperature fluctuations on their phase noise spectra. Our results show the importance of keeping the amplifiers operating in the small-signal regime if they are to be used for applications such as precision electromagnetic measurements and oscillator frequency stabilization.
Keywords :
cryogenics; frequency stability; high electron mobility transistors; low noise amplifiers; microwave amplifiers; microwave oscillators; phase noise; ambient temperature fluctuations; cryogenic microwave amplifiers; cryogenic temperature; energy-efficient microwave low-noise HEMT amplifiers; high-electron-mobility-transistor; noise measurements; noise properties; oscillator frequency stabilization; phase noise spectra; precision electromagnetic measurements; room temperature; temperature 293 K to 298 K; Bridge circuits; Cryogenics; Noise measurement; Phase noise; Voltage measurement;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2014.2946
