DocumentCode :
2520843
Title :
Synthesis, growth and X-ray diffraction studies of langasite crystals
Author :
Gheorghe, L. ; Georgescu, S. ; Mateescu, I. ; Dumitrache, L. ; Borca, E. ; Ranea, C.
Author_Institution :
Nat. Inst. for Lasers, Plasma & Radiat. Phys., Bucharest, Romania
fYear :
2002
fDate :
2002
Firstpage :
320
Lastpage :
323
Abstract :
Langasite family compounds have attracted a lot of attentions because of the combination of a number of nice material properties such as high piezoelectric coupling, temperature compensation and low acoustic loss. Another very important property is that the compound melts congruently so that large single crystals of langasite can be produced by the conventional Czochralski melt pulling technique. This makes the commercial scale production feasible. The structure and phase purity of the grown crystals were checked by powder X-ray diffraction.
Keywords :
X-ray diffraction; crystal growth from melt; crystal structure; lanthanum compounds; piezoceramics; La3Ga5SiO14; acoustic loss; commercial scale production; conventional Czochralski melt pulling technique; grown crystals; langasite crystals; langasite family compounds; phase purity; piezoelectric coupling; powder X-ray diffraction; structure; synthesis; temperature compensation; Crystalline materials; Crystallization; Crystals; Laser theory; Laser transitions; Optical materials; Physics; Powders; X-ray diffraction; X-ray lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and PDA Exhibition, 2002. IEEE International
Print_ISBN :
0-7803-7082-1
Type :
conf
DOI :
10.1109/FREQ.2002.1075900
Filename :
1075900
Link To Document :
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