DocumentCode
252085
Title
An effective conductance cancellation method with minimal design effort
Author
Bin Huang ; Degang Chen
Author_Institution
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
fYear
2014
fDate
3-6 Aug. 2014
Firstpage
258
Lastpage
261
Abstract
An easy-to-implement conductance cancellation method is proposed. To be specific, the only design work involved in the proposed method is to size a transistor in the negative conductance of the NMOS side. In addition, without the aid of any tuning or calibration circuit and under all process corners, the method is able to maintain a DC gain enhancement of over 28.9dB under temperatures between -40 and 80°C, of over 27.6dB under supply voltage between 1.4V and 2V, and of over 29dB under differential output swing between -1.1V and 1.1V. Furthermore, the power and area overhead of the method are respectively only 7% and 3% of those of conventional op amps.
Keywords
MOSFET; DC gain enhancement; NMOS transistor; area overhead; calibration circuit tuning; conductance cancellation method; minimal design effort; negative conductance; op amps; power overhead; process corners; temperature -40 degC to 80 degC; voltage -1.1 V to 1.1 V; voltage 1.4 V; voltage 2 V; Field-flow fractionation; Gain; MOS devices; Operational amplifiers; Temperature dependence; Transistors; Tuning; Conductance cancellation; Gain enhancement;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (MWSCAS), 2014 IEEE 57th International Midwest Symposium on
Conference_Location
College Station, TX
ISSN
1548-3746
Print_ISBN
978-1-4799-4134-6
Type
conf
DOI
10.1109/MWSCAS.2014.6908401
Filename
6908401
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