DocumentCode :
252085
Title :
An effective conductance cancellation method with minimal design effort
Author :
Bin Huang ; Degang Chen
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
fYear :
2014
fDate :
3-6 Aug. 2014
Firstpage :
258
Lastpage :
261
Abstract :
An easy-to-implement conductance cancellation method is proposed. To be specific, the only design work involved in the proposed method is to size a transistor in the negative conductance of the NMOS side. In addition, without the aid of any tuning or calibration circuit and under all process corners, the method is able to maintain a DC gain enhancement of over 28.9dB under temperatures between -40 and 80°C, of over 27.6dB under supply voltage between 1.4V and 2V, and of over 29dB under differential output swing between -1.1V and 1.1V. Furthermore, the power and area overhead of the method are respectively only 7% and 3% of those of conventional op amps.
Keywords :
MOSFET; DC gain enhancement; NMOS transistor; area overhead; calibration circuit tuning; conductance cancellation method; minimal design effort; negative conductance; op amps; power overhead; process corners; temperature -40 degC to 80 degC; voltage -1.1 V to 1.1 V; voltage 1.4 V; voltage 2 V; Field-flow fractionation; Gain; MOS devices; Operational amplifiers; Temperature dependence; Transistors; Tuning; Conductance cancellation; Gain enhancement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (MWSCAS), 2014 IEEE 57th International Midwest Symposium on
Conference_Location :
College Station, TX
ISSN :
1548-3746
Print_ISBN :
978-1-4799-4134-6
Type :
conf
DOI :
10.1109/MWSCAS.2014.6908401
Filename :
6908401
Link To Document :
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