Title :
On The Total Dose Radiation Hardness Of Floating Gate EEPROM Cells
Author :
Wellekens, D. ; Groeseneken, G. ; Van Houdt, J. ; Maes, H.E.
Author_Institution :
IMEC
Keywords :
Charge measurement; Charge pumps; Current measurement; Density measurement; EPROM; Geometry; Guidelines; Nonvolatile memory; Research and development; Threshold voltage;
Conference_Titel :
Nonvolatile Memory Technology Review, 1993
Print_ISBN :
0-7803-1290-2
DOI :
10.1109/NVMT.1993.696956
