High stability evacuated HF crystals

Author

Abramzon, I. ; Boroditsky, R. ; Rudenko, S. ; Podlesnich, Yu.

Author_Institution

VF Technol., MA, USA

fYear

2002

fDate

2002

Firstpage

370

Lastpage

374

Abstract

This work is devoted to results of development of high frequency fundamental mode (HFF) crystal resonators fabricated with an inverted mesa-structure procedure and sealed in HC-45 holders with a high vacuum process. The paper deals with analysis of various resonator parameters. Essential advantages of the vacuum-sealed crystals over conventional ones were observed in long-term frequency stability (aging). About 9 months aging tests with HFF vacuum-sealed units operating at 103-156 MHz shown 0.5-1.0 ppm frequency drift for the first month and 2-3 ppm for the 8 months period at 85°C.

Keywords

Q-factor; VHF devices; ageing; crystal resonators; frequency stability; life testing; packaging; vacuum techniques; 103 to 156 MHz; 8 month; 85 C; 9 month; Ag; Au; HC-45 holders; HFF resonators; Q-factor; VHF operating frequency; aging tests; frequency drift; gold electrodes; high frequency fundamental mode crystal resonators; high vacuum process; high-stability evacuated HF crystal resonators; inverted mesa-structure fabrication; long-term frequency stability; resonator parameter analysis; silver electrodes; vacuum-sealed crystals; Aging; Crystalline materials; Crystals; Electrodes; Frequency; Hafnium; Packaging; Silver; Stability; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium and PDA Exhibition, 2002. IEEE International

Print_ISBN

0-7803-7082-1

Type

conf

DOI

10.1109/FREQ.2002.1075911

Filename

1075911