Title :
High stability evacuated HF crystals
Author :
Abramzon, I. ; Boroditsky, R. ; Rudenko, S. ; Podlesnich, Yu.
Author_Institution :
VF Technol., MA, USA
Abstract :
This work is devoted to results of development of high frequency fundamental mode (HFF) crystal resonators fabricated with an inverted mesa-structure procedure and sealed in HC-45 holders with a high vacuum process. The paper deals with analysis of various resonator parameters. Essential advantages of the vacuum-sealed crystals over conventional ones were observed in long-term frequency stability (aging). About 9 months aging tests with HFF vacuum-sealed units operating at 103-156 MHz shown 0.5-1.0 ppm frequency drift for the first month and 2-3 ppm for the 8 months period at 85°C.
Keywords :
Q-factor; VHF devices; ageing; crystal resonators; frequency stability; life testing; packaging; vacuum techniques; 103 to 156 MHz; 8 month; 85 C; 9 month; Ag; Au; HC-45 holders; HFF resonators; Q-factor; VHF operating frequency; aging tests; frequency drift; gold electrodes; high frequency fundamental mode crystal resonators; high vacuum process; high-stability evacuated HF crystal resonators; inverted mesa-structure fabrication; long-term frequency stability; resonator parameter analysis; silver electrodes; vacuum-sealed crystals; Aging; Crystalline materials; Crystals; Electrodes; Frequency; Hafnium; Packaging; Silver; Stability; Temperature;
Conference_Titel :
Frequency Control Symposium and PDA Exhibition, 2002. IEEE International
Print_ISBN :
0-7803-7082-1
DOI :
10.1109/FREQ.2002.1075911
