Title :
Two-and three-dimensional analysis of polarization profiles in electret materials with thermal pulses
Author :
Aryal, Saurav ; Mellinger, Axel
Author_Institution :
Dept. of Phys., Central Michigan Univ., Mount Pleasant, MI, USA
Abstract :
Three-dimensional polarization distributions in thin electret films can be measured non-destructively using the thermal-pulse technique and the Laser Intensity Modulation Method (LIMM). However, the task of calculating the polarization distribution from the experimentally measured electric current is an ill-posed problem and requires special deconvolution techniques. While the analysis of one-dimensional sample geometries is well understood, there has been no such solution for the two- and the three-dimensional cases. In the past, thermal-pulse experiments have therefore been analyzed using the established one-dimensional techniques, thus sacrificing lateral resolution. In this work, the current signal from several neighboring spots along a scan line is coupled together, and a Monte Carlo method is used for the deconvolution. Preliminary results show that lateral polarization discontinuities are more accurately reproduced with the new approach, resulting in a higher lateral resolution.
Keywords :
Monte Carlo methods; dielectric polarisation; electrets; electric current measurement; laser beam applications; nondestructive testing; Monte Carlo method; current signal; deconvolution technique; electret materials; electric current measurement; ill-posed problem; laser intensity modulation method; polarization profile; scan line; thermal pulse experiments; thermal pulse technique; thin electret films; three-dimensional polarization distribution; Couplings; Electrets; Equations; Laser beams; Mathematical model; Temperature distribution; Thermal analysis;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2011 Annual Report Conference on
Conference_Location :
Cancun
Print_ISBN :
978-1-4577-0985-2
DOI :
10.1109/CEIDP.2011.6232642