Title :
Robust implementation and statistical modeling of a VI-converter
Author :
Graupner, A. ; Schüffny, R.
Author_Institution :
Dept. of Electr. Eng., Tech. Univ. Dresden, Germany
Abstract :
A VI-converter is presented with adjustable transconductance suited for low-power operation through transistors biased in weak and moderate inversion. It can process unipolar differential input voltages or perform a correlated double sampling on a single-ended input signal. The influence of random device parameter variation is considered and a robust circuit topology is suggested which highly compensates it. The circuit is statistically characterized using variance calculation which requires much less computational effort than a Monte-Carlo analysis. The VI-converter is implemented in a 0.6 μm technology on 48×90 μm2 silicon area. The maximum single-ended output current can be up to 1 μA at 5 V supply voltage
Keywords :
CMOS analogue integrated circuits; analogue processing circuits; convertors; image processing equipment; network topology; numerical analysis; statistical analysis; transfer functions; 0.6 μm technology; 0.6 mum; 1 muA; 48×90 μm2 Si area; 5 V; 5 V supply voltage; CMOS imager; Si; VI-converter; computational effort; correlated double sampling; moderate inversion; random device parameter variation; robust circuit topology; single-ended input signal; statistical modeling; unipolar differential input voltages; up to 1 μA; variance calculation; weak inversion; Circuit simulation; Computational modeling; Geometry; Power dissipation; Robustness; Sensor arrays; Signal processing; Signal sampling; Threshold voltage; Transconductance;
Conference_Titel :
Integrated Circuits and Systems Design, 2000. Proceedings. 13th Symposium on
Conference_Location :
Manaus
Print_ISBN :
0-7695-0843-X
DOI :
10.1109/SBCCI.2000.876012
