DocumentCode
2521258
Title
An Automated SONOS NVSM Dynamic Characterization System
Author
Banerjee, Amit K. ; Hu, Yin ; Martin, Matthew G. ; White, Marvin H.
Author_Institution
Sherman Fairchild Center for Solid State Studies
fYear
1993
fDate
22-24 Jun 1993
Firstpage
78
Lastpage
81
Keywords
Automatic test pattern generation; Automatic testing; Automation; Circuit testing; Electron traps; Nonvolatile memory; SONOS devices; Test pattern generators; Threshold voltage; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Nonvolatile Memory Technology Review, 1993
Print_ISBN
0-7803-1290-2
Type
conf
DOI
10.1109/NVMT.1993.696957
Filename
696957
Link To Document