DocumentCode :
2521258
Title :
An Automated SONOS NVSM Dynamic Characterization System
Author :
Banerjee, Amit K. ; Hu, Yin ; Martin, Matthew G. ; White, Marvin H.
Author_Institution :
Sherman Fairchild Center for Solid State Studies
fYear :
1993
fDate :
22-24 Jun 1993
Firstpage :
78
Lastpage :
81
Keywords :
Automatic test pattern generation; Automatic testing; Automation; Circuit testing; Electron traps; Nonvolatile memory; SONOS devices; Test pattern generators; Threshold voltage; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nonvolatile Memory Technology Review, 1993
Print_ISBN :
0-7803-1290-2
Type :
conf
DOI :
10.1109/NVMT.1993.696957
Filename :
696957
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2521258
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