Title :
Material property measurement of granular materials using a calibrated dielectric spectroscopy system
Author :
Wang, Hsiu-Che ; Inclan, Valery ; Zyuzin, Alexei ; Donnangelo, Nicholas ; Mamishev, Alexander
Author_Institution :
Dept. of Mech. Eng., Univ. of Washington, Seattle, WA, USA
Abstract :
Accurate measurement of dielectric properties of granular materials and powders is important in material science, pharmacology, agriculture, and other fields. Granular materials present a wide range of measurement challenges not encountered with solid and liquid samples. This paper presents the calibration process for measurement of granular material properties using a custom-designed dielectric spectroscopy system. The process uses systematic iterative calibration for the individual stages of the measurement circuit, the calibration of the sensor fixture, and the determination of a frequency-dependent phase-shift due to the operational amplifiers in the circuit. The results show that using the calibrated system to measure the air´s relative dielectric permittivity noticeably reduces measurement deviation to 0.5%, from more than 30% in non-calibrated mode. Based on the material dielectric signature acquired in the frequency domain, the measurement system can be used to identify a broad variety of granular materials. Since allowing direct contact with the sensor electrodes is undesirable for some materials, this paper demonstrates how insulating the granular material in a thin film during material property measurement can be taken into account.
Keywords :
calibration; discontinuous metallic thin films; electrodes; iterative methods; permittivity; permittivity measurement; powders; calibrated dielectric spectroscopy system; dielectric permittivity; dielectric properties; frequency domain; frequency-dependent phase-shift; granular material properties; material dielectric signature; material property measurement; operational amplifiers; powders; sensor electrodes; sensor fixture; systematic iterative calibration; thin film; Calibration; Dielectrics; Electrodes; Materials; Permittivity; Permittivity measurement;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2011 Annual Report Conference on
Conference_Location :
Cancun
Print_ISBN :
978-1-4577-0985-2
DOI :
10.1109/CEIDP.2011.6232651