DocumentCode
2521418
Title
Temperature Testing Tight Tolerance Crystal Units
Author
Bistline, George, Jr.
fYear
1963
fDate
1963
Firstpage
314
Lastpage
315
Keywords
Contracts; Frequency; Laboratories; Mass production; Materials testing; Production equipment; Temperature control; Temperature distribution; Temperature measurement; Voltmeters;
fLanguage
English
Publisher
ieee
Conference_Titel
17th Annual Symposium on Frequency Control. 1963
Type
conf
DOI
10.1109/FREQ.1963.201268
Filename
1540258
Link To Document