DocumentCode
2521572
Title
Development of an Apparatus to Diagnose Electronic Instruments from External Thermal Measurements
Author
Moon, H. ; Nakayma, W. ; Jung, S.H. ; Bajracharya, I. ; Lee, S.K.
Author_Institution
GTI, Gwangju Inst. of Sci. & Technol., Gwangju, South Korea
fYear
2008
fDate
9-12 Dec. 2008
Firstpage
1491
Lastpage
1496
Abstract
As electronic devices are miniaturized and their performances are accelerated rapidly, design of a cooling system becomes one of the most important issues. This paper presents development of an apparatus to diagnose a laptop PC from external thermal measurements. The PC is meshed using the finite element method, and the averaged thermal conductivity of each finite element is estimated from the measurement data. In order to obtain sufficient experimental sets, couples of thermal images are obtained while a hot plate is applying the constant various heat input from the bottom side of the PC. An estimation based on the least square method is presented. By minimizing the temperature differences between measured data and calculated ones, the thermal conductance for each finite element is estimated.
Keywords
cooling; finite element analysis; heat systems; instruments; least squares approximations; notebook computers; thermal conductivity; thermal conductivity measurement; cooling system; electronic devices; electronic instruments; finite element method; laptop PC; least square method; thermal conductivity; thermal image couples; Acceleration; Electronics cooling; Finite element methods; Heat transfer; Instruments; Numerical models; Personal communication networks; Power system modeling; Semiconductor device measurement; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference, 2008. EPTC 2008. 10th
Conference_Location
Singapore
Print_ISBN
978-1-4244-2117-6
Electronic_ISBN
978-1-4244-2118-3
Type
conf
DOI
10.1109/EPTC.2008.4763641
Filename
4763641
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