• DocumentCode
    2521572
  • Title

    Development of an Apparatus to Diagnose Electronic Instruments from External Thermal Measurements

  • Author

    Moon, H. ; Nakayma, W. ; Jung, S.H. ; Bajracharya, I. ; Lee, S.K.

  • Author_Institution
    GTI, Gwangju Inst. of Sci. & Technol., Gwangju, South Korea
  • fYear
    2008
  • fDate
    9-12 Dec. 2008
  • Firstpage
    1491
  • Lastpage
    1496
  • Abstract
    As electronic devices are miniaturized and their performances are accelerated rapidly, design of a cooling system becomes one of the most important issues. This paper presents development of an apparatus to diagnose a laptop PC from external thermal measurements. The PC is meshed using the finite element method, and the averaged thermal conductivity of each finite element is estimated from the measurement data. In order to obtain sufficient experimental sets, couples of thermal images are obtained while a hot plate is applying the constant various heat input from the bottom side of the PC. An estimation based on the least square method is presented. By minimizing the temperature differences between measured data and calculated ones, the thermal conductance for each finite element is estimated.
  • Keywords
    cooling; finite element analysis; heat systems; instruments; least squares approximations; notebook computers; thermal conductivity; thermal conductivity measurement; cooling system; electronic devices; electronic instruments; finite element method; laptop PC; least square method; thermal conductivity; thermal image couples; Acceleration; Electronics cooling; Finite element methods; Heat transfer; Instruments; Numerical models; Personal communication networks; Power system modeling; Semiconductor device measurement; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2008. EPTC 2008. 10th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-2117-6
  • Electronic_ISBN
    978-1-4244-2118-3
  • Type

    conf

  • DOI
    10.1109/EPTC.2008.4763641
  • Filename
    4763641