• DocumentCode
    252160
  • Title

    Single-cell membrane surgery by virtual electrodes using an inverted electron beam lithography system

  • Author

    Yoshioka, M. ; Miyazako, H. ; Wagastuma, A. ; Mabuchi, K. ; Hoshino, T.

  • Author_Institution
    Sch. of Inf. Sci. & Technol., Univ. of Tokyo, Tokyo, Japan
  • fYear
    2014
  • fDate
    13-15 Dec. 2014
  • Firstpage
    68
  • Lastpage
    71
  • Abstract
    Single cell manipulation had been applied to various analyses of cell functions, however, the nanometer size surgery tools for the single cell analysis was limited the resolution and rapidly. We proposed here a single cell manipulation using a fine focused electron beam. Since the electron beam could provide virtual electrodes which promoted electric influences and they were focused in sub-micrometers, the fine manipulation could performed subcellular surgery of the single living cell. By using our method with an inverted electron beam lithography system, we reported here the electrokinetic induced poration of localized single cells and subcellular detachment. Observing this poration, the electron beam irradiation induced PI dye inflow into the single living cells and their fluorescence were confirmed. Although the viability of the treated cells was still unclear, the poration probability by our method was demonstrated.
  • Keywords
    biomedical electrodes; biomedical optical imaging; biomembranes; cellular biophysics; dyes; electrokinetic effects; electron beam lithography; fluorescence; muscle; probability; surgery; cell functions; electrokinetic induced poration; electron beam irradiation induced PT dye inflow; fine focused electron beam; fluorescence; inverted electron beam lithography system; localized single cells; nanometer size surgery tools; poration probability; single cell analysis; single cell manipulation; single living cell; single-cell membrane surgery; subcellular detachment; subcellular surgery; virtual electrodes; Electrodes; Electron beams; Fluorescence; Imaging; Radiation effects; Shape; Silicon compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    System Integration (SII), 2014 IEEE/SICE International Symposium on
  • Conference_Location
    Tokyo
  • Print_ISBN
    978-1-4799-6942-5
  • Type

    conf

  • DOI
    10.1109/SII.2014.7028013
  • Filename
    7028013