DocumentCode :
252160
Title :
Single-cell membrane surgery by virtual electrodes using an inverted electron beam lithography system
Author :
Yoshioka, M. ; Miyazako, H. ; Wagastuma, A. ; Mabuchi, K. ; Hoshino, T.
Author_Institution :
Sch. of Inf. Sci. & Technol., Univ. of Tokyo, Tokyo, Japan
fYear :
2014
fDate :
13-15 Dec. 2014
Firstpage :
68
Lastpage :
71
Abstract :
Single cell manipulation had been applied to various analyses of cell functions, however, the nanometer size surgery tools for the single cell analysis was limited the resolution and rapidly. We proposed here a single cell manipulation using a fine focused electron beam. Since the electron beam could provide virtual electrodes which promoted electric influences and they were focused in sub-micrometers, the fine manipulation could performed subcellular surgery of the single living cell. By using our method with an inverted electron beam lithography system, we reported here the electrokinetic induced poration of localized single cells and subcellular detachment. Observing this poration, the electron beam irradiation induced PI dye inflow into the single living cells and their fluorescence were confirmed. Although the viability of the treated cells was still unclear, the poration probability by our method was demonstrated.
Keywords :
biomedical electrodes; biomedical optical imaging; biomembranes; cellular biophysics; dyes; electrokinetic effects; electron beam lithography; fluorescence; muscle; probability; surgery; cell functions; electrokinetic induced poration; electron beam irradiation induced PT dye inflow; fine focused electron beam; fluorescence; inverted electron beam lithography system; localized single cells; nanometer size surgery tools; poration probability; single cell analysis; single cell manipulation; single living cell; single-cell membrane surgery; subcellular detachment; subcellular surgery; virtual electrodes; Electrodes; Electron beams; Fluorescence; Imaging; Radiation effects; Shape; Silicon compounds;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
System Integration (SII), 2014 IEEE/SICE International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
978-1-4799-6942-5
Type :
conf
DOI :
10.1109/SII.2014.7028013
Filename :
7028013
Link To Document :
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