Title :
The Architecture Of Wafer Scale Memories With Giant Magneto-resistance Memory Cells
Author :
Spears, K. ; Pohm, A.V. ; Daughton, J.M. ; Sinclair, R. ; Brown, J.
Author_Institution :
Nonvolatile Electronics
Keywords :
Electronics industry; Electronics packaging; Error correction; Industrial electronics; Magnetic materials; Magnetic properties; Nonvolatile memory; Power generation economics; Power supplies; Semiconductor device packaging;
Conference_Titel :
Nonvolatile Memory Technology Review, 1993
Print_ISBN :
0-7803-1290-2
DOI :
10.1109/NVMT.1993.696963