DocumentCode :
2521895
Title :
Analysis and optimization of mismatch and parasitics in pipelined ADCs
Author :
Wang, Yu ; Yang, Hai-gang ; Cheng, Xin ; Yin, Tao
Author_Institution :
Inst. of Electron., Chinese Acad. of Sci. (CAS), Beijing, China
fYear :
2010
fDate :
15-17 Dec. 2010
Firstpage :
1
Lastpage :
4
Abstract :
The mismatch and parasitics of layout and process in pipelined ADCs are analyzed in this paper and an optimized system has been implemented. Based on the model establishment of the proposed ADC, the offset of input in each stage and the fluctuation of reference voltage, which degrades the effective resolution of pipelined ADCs, caused by transistors mismatches and parasitic effects are modeled and estimated. The error bounds are also derived to optimize the ADC´s properties. After careful design in schematic and layout, a 12bit pipelined ADC is realized in a commercial CMOS 0.35μm process. The post layout simulations show that the circuit achieves 69.3dB signal-to-noise-and-distortion ratio (SNDR), 80.1dB spurious free dynamic range (SFDR) and -80.1dB total harmonic distortion (THD) operating up to the 40MHz sampling clock, which proves the beneficial of the analysis and optimization.
Keywords :
CMOS integrated circuits; analogue-digital conversion; harmonic distortion; CMOS process; analog-to-digital converters; mismatch optimization; parasitic effects; pipelined ADC; signal to noise and distortion ratio; size 0.35 mum; total harmonic distortion; transistors mismatch; word length 12 bit; Integrated circuit modeling; Layout; Mathematical model; Optimization; Routing; Semiconductor device modeling; Transistors; layout and process; model; non-ideal; pipelined ADC;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2010 IEEE International Conference of
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-9997-7
Type :
conf
DOI :
10.1109/EDSSC.2010.5713768
Filename :
5713768
Link To Document :
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