Title :
Efficient νMOS realization of threshold voters for self-purging redundancy
Author :
Quintana, J.M. ; Avedillo, M.J. ; Rodriguez-Villegas, E. ; Rueda, A.
Author_Institution :
Inst. de Microelectron., Centro Nacional de Microelectron., Seville, Spain
Abstract :
In spite of its very simple switching mechanism, straightforward design, and that it is more simple and reliable than other hybrid approaches, self-purging hybrid technique is not commonly used for fault tolerance mainly due to the lacking of practical implementations of its key component the threshold voter. This paper presents an efficient realization of the classic Losq´s self-purging redundancy scheme with automatic threshold adjustment to provide the best tolerance to multiple failures during all the system´s lifetime. Our implementation solves the difficulty imposed by the circuit realization of the threshold gate by resorting to the νMOS concept and to a very efficient decomposition technique
Keywords :
CMOS logic circuits; combinational circuits; fault tolerance; integrated circuit reliability; logic gates; neural chips; redundancy; sorting; threshold logic; νMOS concept; automatic threshold adjustment; circuit realization; combinational circuit; efficient decomposition technique; efficient neuron-MOS realization; fault masking; fault tolerance; floating gate concept; self-purging redundancy; sorter; threshold gate; threshold voters; tolerance to multiple failures; Circuits; Clocks; Fault tolerance; Hardware; Redundancy; Switches; Tin; Voting;
Conference_Titel :
Integrated Circuits and Systems Design, 2000. Proceedings. 13th Symposium on
Conference_Location :
Manaus
Print_ISBN :
0-7695-0843-X
DOI :
10.1109/SBCCI.2000.876049