• DocumentCode
    2521949
  • Title

    Improved performance of low-voltage pentacene OTFTs by Incorporating La to Hafinium Oxide Gate dielectric

  • Author

    Deng, L.F. ; Lai, P.T. ; Tao, Q.B. ; Choi, H.W. ; Chen, W.B. ; Che, C.M. ; Xu, J.P. ; Liu, Y.R.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
  • fYear
    2010
  • fDate
    15-17 Dec. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Pentacene OTFTs with HfLaO or HfO2 as gate dielectric were fabricated. The dielectrics were prepared by sputtering method and then annealed in NH3 at 400 oC. The k value for the HfLaO and HfO2 films amounted to 12.3 and 11.8 respectively. Both of the OTFTs could operate with a supply voltage of -5 V. The mobility of the OTFT with HfLaO gate dielectric was 0.688 cm2/Vs, which was much higher than that of the OTFT with HfO2 gate dielectric. Moreover, the HfLaO-based OTFT obtained smaller sub-threshold swing, larger drive current and larger on/off current ratio than the HfO2-baesd OTFT. The superior performance of the HfLaO-based OTFT is due to its better interfacial characteristics between the dielectric and the organic semiconductor. SEM images revealed that the pentacene film on HfLaO was more uniform and its grains were larger. C-V measurement indicated that Au-pentacene-HfLaO-Si structure displayed less hysteresis than Au-pentacene-HfO2-Si structure.
  • Keywords
    annealing; carrier mobility; dielectric hysteresis; hafnium compounds; high-k dielectric thin films; organic semiconductors; scanning electron microscopy; semiconductor thin films; sputtered coatings; thin film transistors; C-V measurement; HfLaO; HfO2; SEM; annealing; carrier mobility; dielectric hysteresis; hafinium oxide gate dielectric; low voltage pentacene OTFT; pentacene film; sputtering method; temperature 400 degC; Dielectrics; Hafnium compounds; Lifting equipment; Logic gates; Organic thin film transistors; Pentacene; HfLaO; HfO2; OTFT; dielectric; high k;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits (EDSSC), 2010 IEEE International Conference of
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-9997-7
  • Type

    conf

  • DOI
    10.1109/EDSSC.2010.5713771
  • Filename
    5713771