DocumentCode :
2522012
Title :
High sensitivity phase and amplitude measurement of low Fourier frequency phenomena
Author :
Rubiola, Enrico ; Giordano, Vincent
Author_Institution :
ESSTIN, Univ. Henri Poincare, Nancy, France
fYear :
2002
fDate :
2002
Firstpage :
703
Lastpage :
709
Abstract :
A substantial progress in understanding the flicker noise mechanism of the interferometric phase noise measurements results in new scheme that improves the sensitivity at low Fourier frequencies by 20-30 dB upon the previous instruments [Rev. Sci. Instr. 73 (6) 2445-2457 (2002)]. The new scheme also features automatic carrier suppression and simplified carrier suppression. Two prototypes have been constructed, designed for the carrier frequency of 100 MHz and 5 MHz, with similar performances. A residual noise of -175 to -180 dB dBrad2/Hz has been obtained at f = 1 Hz off the carrier in real-time measurements, while exploiting the correlation-and-averaging method in similar conditions the sensitivity is some -182 dBrad2/Hz (parallel detection), and -186 dBrad2/Hz (± 45° detection) at f = 1 Hz. A residual white noise of -203 dBrad2/Hz has been obtained at f = 250 Hz off the carrier, while the ultimate noise floor is still limited by the averaging capability of the correlator. The instruments have been tested measuring the noise of by-step attenuators and 180° hybrids, which is below -170 dBrad2/Hz at f = 1 Hz.
Keywords :
electric noise measurement; flicker noise; phase noise; radiowave interferometry; white noise; 100 MHz; 5 MHz; amplitude measurement; automatic carrier suppression; averaging capability; by-step attenuators; carrier frequency; correlation-and-averaging method; flicker noise mechanism; interferometric phase noise measurements; low Fourier frequency phenomena; residual noise; residual white noise; 1f noise; Correlators; Frequency measurement; Instruments; Noise measurement; Phase measurement; Phase noise; Prototypes; Testing; White noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and PDA Exhibition, 2002. IEEE International
Print_ISBN :
0-7803-7082-1
Type :
conf
DOI :
10.1109/FREQ.2002.1075972
Filename :
1075972
Link To Document :
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