• DocumentCode
    2522327
  • Title

    Research on pulsed high power microwave generation in the 1980s

  • Author

    Granatstein, V.L.

  • Author_Institution
    Lab. for Plasma Res., Maryland Univ., College Park, MD, USA
  • fYear
    1989
  • fDate
    3-6 Dec. 1989
  • Firstpage
    367
  • Lastpage
    370
  • Abstract
    In the study of microwave generation using intense, short pulses of relativistic electrons, a measure of performance is peak power divided by the square of the wavelength (i.e. P/ lambda /sup 2/). This measure has exceeded 1 GW/cm/sup 2/ in several experiments, over a wavelength range from 2 mm to 3 cm. Moreover, these experiments have generally demonstrated high accompanying efficiency in the range 30 to 50%. For lambda >or approximately=1 cm, the highest power and efficiency have been achieved in multiwave Cerenkov generators with large diameter, i.e. D/ lambda >>1. A plasma-filled BWO (backward-wave oscillator) experiment which has shown high efficiency may also be explainable by multiwave effects. At millimeter wavelengths, the most impressive results have been obtained with free electron lasers, that use a tapered wiggler. Both the multiwave effect and the tapered wiggler ensure energy extraction from the electron beam over an extended range as electron energy decreases.<>
  • Keywords
    backward wave tubes; free electron lasers; microwave generation; microwave tubes; pulse generators; relativistic electron beam tubes; wigglers; 2 to 30 mm; 30 to 50 percent; backward-wave oscillator; electron beam; electron energy; energy extraction; free electron lasers; high accompanying efficiency; millimeter wavelengths; multiwave Cerenkov generators; peak power; plasma-filled BWO; pulsed high power microwave generation; relativistic electrons; tapered wiggler; Electron beams; High power microwave generation; Microwave generation; Microwave measurements; Plasma waves; Power generation; Power measurement; Pulse measurements; Undulators; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1989. IEDM '89. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-0817-4
  • Type

    conf

  • DOI
    10.1109/IEDM.1989.74299
  • Filename
    74299