• DocumentCode
    2522445
  • Title

    Secondary electron emission

  • Author

    Shroff, A.M. ; Tonnerre, J.C.

  • Author_Institution
    Thomson Tubes Electroniques, Boulogne-Billancourt, France
  • fYear
    1989
  • fDate
    3-6 Dec. 1989
  • Firstpage
    375
  • Lastpage
    378
  • Abstract
    The secondary electron emission of pure metals, cathodes and insulators was measured. The secondary electron emission yield was measured at room temperature and at temperatures up to 1100 degrees C. The cathodes were life-tested at 850 degrees C and were measured at regular intervals at room temperature during a period of 10000 h. The best pure material for cathodes was found to be platinum, while oxide cathodes were the best candidates among complex cathodes. The secondary emission of thin insulating films of alumina and magnesium oxide was also investigated. The results found are in good agreement with those published.<>
  • Keywords
    alumina; cathodes; insulating thin films; magnesium compounds; metals; secondary electron emission; 10000 h; 27 to 1100 degC; Al/sub 2/O/sub 3/; MgO; cathodes; complex cathodes; insulators; pure metals; room temperature; secondary electron emission; secondary electron emission yield; thin insulating films; Cathodes; Current measurement; Diodes; Electron beams; Electron emission; Electron tubes; Insulation; Temperature measurement; Testing; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1989. IEDM '89. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-0817-4
  • Type

    conf

  • DOI
    10.1109/IEDM.1989.74301
  • Filename
    74301