Title :
Joint maximum-likelihood data and bit synchronization epoch estimation for burst direct sequence spread-spectrum transmission
Author :
Rezeanu, Stefan-Cristian ; Ziemer, Rodger E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado Univ., Colorado Springs, CO, USA
Abstract :
We derive the optimal joint maximum-likelihood (ML) estimator of the bit synchronization epoch and data bit values for a short burst direct-sequence spread-spectrum (DSSS) transmission, for both the white and colored noise environments. The DSSS signal is assumed already downconverted and despread. We show that the additional computational burden incurred by using the estimator derived for the colored noise case is not justified. We then develop a fast acquisition suboptimal algorithm and analyze its performance. The suboptimal algorithm reduces the computational cost by more than one order of magnitude on the average, at no accuracy expense for carrier-to-noise ratios which insure the reliable estimation of the carrier phase, carrier Doppler and spreading code epoch
Keywords :
Doppler effect; Gaussian noise; maximum likelihood estimation; phase estimation; pseudonoise codes; signal processing; spread spectrum communication; synchronisation; white noise; AWGN; DSSS signal; DSSS transmission; bit synchronization; bit synchronization epoch estimation; burst direct sequence spread-spectrum transmission; carrier Doppler estimation; carrier phase estimation; carrier-to-noise ratios; colored noise; computational cost reduction; data synchronization epoch estimation; fast acquisition suboptimal algorithm; low pass filtering; optimal joint maximum-likelihood estimator; performance analysis; signal processing; spreading code epoch; white noise; Additive white noise; Colored noise; Delay estimation; Demodulation; Gaussian noise; Maximum likelihood estimation; Phase estimation; Spread spectrum communication; Statistical analysis; Testing;
Conference_Titel :
Military Communications Conference, 1996. MILCOM '96, Conference Proceedings, IEEE
Conference_Location :
McLean, VA
Print_ISBN :
0-7803-3682-8
DOI :
10.1109/MILCOM.1996.571387