• DocumentCode
    2522539
  • Title

    Expected Bayesian credible limit of reliability parameters in the case of zero-failure data for exponential distribution

  • Author

    Tianqun, Xu ; Yuepeng, Chen ; Tianhe, Xu ; Huanbin, Liu

  • Author_Institution
    Sch. of Sci., Wuhan Univ. of Technol., Wuhan, China
  • fYear
    2011
  • fDate
    23-25 May 2011
  • Firstpage
    3163
  • Lastpage
    3168
  • Abstract
    E-Bayesian credible limit estimations of failure rate, mean life and reliability based on four different prior distributions of hyper parameter are given for zero-failure data from products with exponential distribution. Relations among E-Bayesian credible limits and classical confidence limit are discussed. The results show that E-Bayesian credible limits are superior to the classical confidence limit. Finally, calculation is performed according to practical problem, and the analysis of estimation result is carried on.
  • Keywords
    Bayes methods; estimation theory; exponential distribution; reliability theory; E-Bayesian credible limit estimation; confidence limit; expected Bayesian credit limit; exponential distribution; failure rate; reliability parameter; zero-failure data; Bayesian methods; Copper; Density functional theory; Estimation; Exponential distribution; Reliability theory; E-Bayesian credible limit; exponential distribution; failure rate; reliability; zero-failure data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control and Decision Conference (CCDC), 2011 Chinese
  • Conference_Location
    Mianyang
  • Print_ISBN
    978-1-4244-8737-0
  • Type

    conf

  • DOI
    10.1109/CCDC.2011.5968800
  • Filename
    5968800