Title :
Analytical methods to assess transient faults effects in logic circuits
Author :
Alves de Barros Naviner, Lirida
Author_Institution :
Inst. Mines-Telecom, Telecom ParisTech, Paris, France
Abstract :
This work addresses transient faults in deep submicron technologies. We focus on reliability assessment approaches highlighting those based on analytical models. The paper includes a description of solutions reported in the literature and discusses their suitability from a reliability improvement perspective.
Keywords :
integrated circuit reliability; logic circuits; analytical models; deep submicron technologies; logic circuits; reliability assessment approaches; transient faults effects; Circuit faults; Integrated circuit modeling; Integrated circuit reliability; Logic circuits; Logic gates; Transient analysis;
Conference_Titel :
Circuits and Systems (MWSCAS), 2014 IEEE 57th International Midwest Symposium on
Conference_Location :
College Station, TX
Print_ISBN :
978-1-4799-4134-6
DOI :
10.1109/MWSCAS.2014.6908503
