Title :
Characterization of multiconductor coupled lines from multiport TDR measurements
Author :
Tripathi, A. ; Tripathi, V.K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
Abstract :
A new procedure to characterize nonuniform coupled multiconductor lines based on a one dimensional peeling algorithm is presented. The measured multiport reflection (scattering parameter) parameters in the time domain are used to construct piece-wise uniform configuration oriented models for multiple coupled lines. Examples of nonuniform two and three coupled striplines are included to illustrate the technique.
Keywords :
S-parameters; deconvolution; electric admittance; microwave reflectometry; multiport networks; piecewise-linear techniques; strip lines; time-domain reflectometry; 1D deconvolution algorithms; multiconductor coupled lines; multiple coupled lines; multiport TDR measurements; multiport reflection parameters; nonuniform coupled multiconductor lines; nonuniform three coupled striplines; nonuniform two coupled striplines; one dimensional peeling algorithm; piece-wise uniform configuration oriented models; scattering parameter; time domain; Admittance; Coupling circuits; Data mining; Electric variables measurement; Multiconductor transmission lines; Reflection; Time measurement; Transmission line matrix methods; Transmission line measurements; Voltage;
Conference_Titel :
Microwave Symposium Digest, 1997., IEEE MTT-S International
Conference_Location :
Denver, CO, USA
Print_ISBN :
0-7803-3814-6
DOI :
10.1109/MWSYM.1997.596881
