Title :
Signal characterization effect on adaptive superresolution algorithms
Author :
Bahie-Eldin, Mostafa A.
Author_Institution :
Dept. of Commun., Mil. Tech. Coll., Cairo, Egypt
Abstract :
In this paper, we examine a high resolution direction of arrival (DOA) estimation techniques. Among these algorithms which can yield accurate DOA estimates for multiple narrow band sources are Gabierl´s thermal noise, adaptive angular response, and maximum-likelihood method. These algorithms are capable of detecting pulses that exist for short periods of time. Under this environment, the performance of different adaptive superresolution array algorithms that utilize the Howell-Applebaum technique is compared. Two different cases are discussed. Firstly, the adaptive array is subjected to only one signal plus thermal noise. Secondly, the case of the presence of two incident signals plus thermal noise is investigated. It is shown that every algorithm offers its best performance depending upon the incident signal parameters, number of antennas, the range of input signal-to-noise ratio, and the angle of separation between the incoming signals
Keywords :
adaptive antenna arrays; adaptive signal processing; array signal processing; direction-of-arrival estimation; linear antenna arrays; maximum likelihood estimation; random noise; signal resolution; spectral analysis; thermal noise; DOA estimation; Gabierl´s thermal noise; Howell-Applebaum technique; adaptive angular response; adaptive antenna array; adaptive superresolution array algorithms; high resolution direction of arrival estimation; input signal-to-noise ratio; maximum-likelihood method; multiple narrow band sources; separation angle; signal characterization effect; Adaptive arrays; Direction of arrival estimation; Narrowband; Sensor arrays; Signal processing algorithms; Signal resolution; Signal to noise ratio; Space vector pulse width modulation; Spatial resolution; Working environment noise;
Conference_Titel :
Military Communications Conference, 1996. MILCOM '96, Conference Proceedings, IEEE
Conference_Location :
McLean, VA
Print_ISBN :
0-7803-3682-8
DOI :
10.1109/MILCOM.1996.571408