DocumentCode
2522867
Title
BREAKING THE RESOLUTION BARRIER IN OPTICAL MICROSCOPY: A NEW RESOLUTION MEASURE WITH APPLICATIONS TO SINGLE MOLECULE IMAGING
Author
Ram, Sripad ; Ward, E. Sally ; Ober, Raimund J.
Author_Institution
Center for Immunology, Texas Univ. Southwestern Med. Center, Dallas, TX
fYear
2007
fDate
12-15 April 2007
Firstpage
928
Lastpage
931
Abstract
Rayleigh´s resolution criterion, although extensively used in optical microscopy, is well known to be based on heuristic notions. In fact, recent single molecule experiments have shown that this criterion can be surpassed in a regular optical microscope. The inadequacy of Rayleigh´s criterion has necessitated a reassessment of the resolution limits of optical microscopes. Recently, we proposed a new resolution measure that overcomes the limitations of Rayleigh´s criterion. Known as the fundamental resolution measure FREM, our new result predicts that distances well below Rayleigh´s limit can be resolved in an optical microscope. The effect of deteriorating experimental factors on the new resolution measure is also investigated. Further, it is experimentally verified that distances well below Rayleigh´s limit can be measured from images of closely spaced single molecules with an accuracy as predicted by the new resolution measure. We have also addressed an important problem in single molecule microscopy that concerns the accuracy with which the location of a single molecule can be determined. In particular, we have derived analytical expressions for the limit to the 2D/3D localization accuracy of a single molecule.
Keywords
image resolution; molecular biophysics; optical microscopy; FREM; Rayleigh resolution; optical microscopy; single molecule experiments; Biomedical imaging; Biomedical measurements; Biomedical optical imaging; Detectors; Image resolution; Optical imaging; Optical microscopy; Optical noise; Optical sensors; Parameter estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging: From Nano to Macro, 2007. ISBI 2007. 4th IEEE International Symposium on
Conference_Location
Arlington, VA
Print_ISBN
1-4244-0672-2
Electronic_ISBN
1-4244-0672-2
Type
conf
DOI
10.1109/ISBI.2007.357005
Filename
4193439
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