DocumentCode :
2523166
Title :
Design of experiments in BDD variable ordering: lessons learned
Author :
Harlow, J.E., III ; Brglez, F.
Author_Institution :
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
fYear :
1998
fDate :
8-12 Nov. 1998
Firstpage :
646
Lastpage :
652
Abstract :
Applying the design of experiments methodology to the evaluation of BDD variable ordering algorithms has yielded a number of conclusive results. The methodology relies on the equivalence classes of functionally perturbed circuits that maintain logic invariance, or are within (1, 2, ...)-minterms of the original reference circuit function, also maintaining entropy-invariance. For some of the current variable ordering algorithms and tools, the negative results include: statistically significant sensitivity to naming of variables; confirmation that a number of variable ordering algorithms are statistically equivalent to a random variable order assignment; and observation of a statistically anomalous variable ordering behavior of a well known benchmark circuit isomorphic class when analyzed under single and multiple outputs. On the positive side, the methodology supports a statistically significant merit evaluation of any newly introduced variable ordering algorithm, including the one briefly introduced in this paper.
Keywords :
VLSI; binary decision diagrams; design of experiments; equivalence classes; logic CAD; BDD; CAD; benchmark circuit isomorphic class; binary decision diagrams; design of experiments; entropy-invariance; equivalence classes; functionally perturbed circuits; logic invariance; random variable order assignment; reference circuit function; variable ordering; Algorithm design and analysis; Binary decision diagrams; Circuits; Collaboration; Design automation; Design methodology; Packaging; Permission; US Department of Energy; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 1998. ICCAD 98. Digest of Technical Papers. 1998 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
1-58113-008-2
Type :
conf
DOI :
10.1109/ICCAD.1998.144337
Filename :
743087
Link To Document :
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