DocumentCode :
2523175
Title :
A physical model for nanosecond partial discharge
Author :
Yonghong, Cheng ; Hengkun, Xie
Author_Institution :
State Key Lab. of Electr. Insulation for Power Equip., Xi´´an Jiaotong Univ., China
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
697
Abstract :
Using an ultra-wideband detection system, the characteristics of a partial discharge are studied. The new detection results are different from traditional experimental results in the time-domain. Based on collision ionization theory, a new physical model is put forward for analyzing the new detection results in this paper. In the new model, the second emission resulting from the ion impacting cathode and photoelectron radiation is considered. The electron current and positive ion current of the first ionization, electron current resulting from the ion impacting cathode and photoelectron radiation in the nanosecond discharge process are computed in this paper. Each generation discharge current is obtained, and a computing discharge waveform is obtained. The theoretical computed current waveform is no different from the measured nanosecond discharge waveform. It is shown that the new model can interpret the detection results
Keywords :
high-speed techniques; insulation testing; partial discharge measurement; photoemission; plasma collision processes; plasma diagnostics; plasma simulation; collision ionization theory; discharge waveform; electron current; generation discharge current; ion impacting cathode; nanosecond partial discharge; photoelectron radiation; physical model; positive ion current; ultra-wideband detection system; Attenuation; Cathodes; Current measurement; Detectors; Electron emission; Ionization; Partial discharge measurement; Partial discharges; Power system modeling; Ultra wideband technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 2000. Proceedings of the 6th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
0-7803-5459-1
Type :
conf
DOI :
10.1109/ICPADM.2000.876118
Filename :
876118
Link To Document :
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