Title :
Leakage and delay analysis in FinFET array multiplier circuits
Author :
Whitehouse, Joseph ; John, Eugene
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Texas San Antonio, San Antonio, TX, USA
Abstract :
This paper investigates the performance of array multipliers utilizing FinFET models for the following feature sizes: 20nm, 16nm, 14nm, 10nm and 7nm. Using basic array multiplier topology and standard cell 28 transistor full adders, the static power and delay of FinFET array multiplier circuits were investigated using HSPICE and low power Predictive Technology Models (PTM). Simulation results show an increase in static power and a decrease in delay as the feature size decreases. Comparisons between array multiplier sizes show nonlinear increases in both static power and delay as size increases from 4×4 up to 16×16. The results obtained in this research will provide a starting point for the design and analysis of more complex FinFET based arithmetic circuit designs.
Keywords :
MOSFET circuits; adders; delays; logic design; low-power electronics; multiplying circuits; FinFET array multiplier circuits; FinFET based arithmetic circuit designs; HSPICE; PTM; array multiplier topology; delay; delay analysis; leakage analysis; low power predictive technology models; size 10 nm; size 14 nm; size 16 nm; size 20 nm; size 7 nm; standard cell transistor full adders; Arrays; CMOS integrated circuits; Delays; FinFETs; Integrated circuit modeling; Logic gates;
Conference_Titel :
Circuits and Systems (MWSCAS), 2014 IEEE 57th International Midwest Symposium on
Conference_Location :
College Station, TX
Print_ISBN :
978-1-4799-4134-6
DOI :
10.1109/MWSCAS.2014.6908563