DocumentCode :
2523812
Title :
Using insulation aging to size transformers in high-ambient temperature, secondary-selective applications
Author :
Helfrich, A. ; Carlson, Ronald W.
Author_Institution :
Saudi Arabian Oil Co., Saudi Arabia
fYear :
2012
fDate :
24-26 Sept. 2012
Firstpage :
1
Lastpage :
6
Abstract :
The electrical distribution systems in industrial facilities often incorporate a secondary-selective design where loads are fed from redundant transformers normally loaded to less than 50% of their kVA rating. When transformers are operating in ambient temperatures above 30 °C, IEEE Std C57.91 provides guidelines on how to load the transformers to compensate for the accelerated insulation aging. This guide is not directly applicable to secondary-selective systems since it assumes the transformer is being sized to supply the entire load on a continuous basis. This paper describes an approach for using insulation aging to size the transformer with an example using actual historical temperature data from an oil-production facility in a Middle-East country. The paper will demonstrate that transformers operating in a secondary-selective application do not have to be derated even when operating at ambient temperatures far in excess of the rated 30 °C. The resulting safety and economic benefits of the lower transformer kVA rating cascade throughout the power system.
Keywords :
ageing; distribution networks; power transformer insulation; production facilities; IEEE Std C57.91; Middle-East country; accelerated insulation aging; electrical distribution systems; high-ambient temperature; historical temperature data; industrial facility; oil-production facility; power system; secondary-selective applications; secondary-selective design; secondary-selective systems; size transformers; Power distribution; Power transformers; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Petroleum and Chemical Industry Technical Conference (PCIC), 2012 Record of Conference Papers Industry Applications Society 59th Annual IEEE
Conference_Location :
Chicago, IL
ISSN :
0090-3507
Print_ISBN :
978-1-4673-0924-0
Type :
conf
DOI :
10.1109/PCICON.2012.6549663
Filename :
6549663
Link To Document :
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