Experimental circuit model generation of non-uniform coupled multi-conductor structures

In the paper a new method is described for the experimental circuit modeling of non-uniform coupled multi-conductor structures. The method can handle a large number of coupled conductors N since it reduces the modeling of the 2N-port to the modeling of a number easier to model 4-port structures. All electrical properties, such as reflection, transmission, backward and forward crosstalk between the conductors of the structure are included in the model. To illustrate the method, a 35-pins high density backplane connector is modeled.