• DocumentCode
    2524005
  • Title

    Reliability Demonstration Testing Method for Safety-Critical Embedded Applications Software

  • Author

    Qin, Zhidong ; Chen, Hui ; Shi, Youqun

  • Author_Institution
    Sch. of Comput., Donghua Univ., Shanghai
  • fYear
    2008
  • fDate
    29-31 July 2008
  • Firstpage
    481
  • Lastpage
    487
  • Abstract
    In order to solve the problem that the fixed duration testing method, which based on the classical statistics, canpsilat satisfy the requirements of reliability testing for modern safety-critical embedded applications software due to the long testing duration, a hierarchical reliability demonstration approach was provided in this paper. The method unified architecture-based reliability modeling, maximum entropy principle and Bayesian inference. Numeral simulation shows that it is effective to reduce the testing duration without decreasing the confidence level for the testing results.
  • Keywords
    belief networks; embedded systems; inference mechanisms; maximum entropy methods; program testing; safety-critical software; software architecture; Bayesian inference; architecture-based reliability modeling; maximum entropy principle; numeral simulation; reliability demonstration testing; safety-critical embedded application software; Application software; Bayesian methods; Embedded computing; Embedded software; Software reliability; Software safety; Software testing; Statistical analysis; Statistics; System testing; reliability demonstration testing; safety-critical software; software reliability; software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Embedded Software and Systems, 2008. ICESS '08. International Conference on
  • Conference_Location
    Sichuan
  • Print_ISBN
    978-0-7695-3287-5
  • Type

    conf

  • DOI
    10.1109/ICESS.2008.76
  • Filename
    4595600