Title :
Reliability Demonstration Testing Method for Safety-Critical Embedded Applications Software
Author :
Qin, Zhidong ; Chen, Hui ; Shi, Youqun
Author_Institution :
Sch. of Comput., Donghua Univ., Shanghai
Abstract :
In order to solve the problem that the fixed duration testing method, which based on the classical statistics, canpsilat satisfy the requirements of reliability testing for modern safety-critical embedded applications software due to the long testing duration, a hierarchical reliability demonstration approach was provided in this paper. The method unified architecture-based reliability modeling, maximum entropy principle and Bayesian inference. Numeral simulation shows that it is effective to reduce the testing duration without decreasing the confidence level for the testing results.
Keywords :
belief networks; embedded systems; inference mechanisms; maximum entropy methods; program testing; safety-critical software; software architecture; Bayesian inference; architecture-based reliability modeling; maximum entropy principle; numeral simulation; reliability demonstration testing; safety-critical embedded application software; Application software; Bayesian methods; Embedded computing; Embedded software; Software reliability; Software safety; Software testing; Statistical analysis; Statistics; System testing; reliability demonstration testing; safety-critical software; software reliability; software testing;
Conference_Titel :
Embedded Software and Systems, 2008. ICESS '08. International Conference on
Conference_Location :
Sichuan
Print_ISBN :
978-0-7695-3287-5
DOI :
10.1109/ICESS.2008.76