DocumentCode
2524017
Title
Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment
Author
Nigh, Phil ; Vallett, Dave ; Patel, Atul ; Wright, Jason ; Motika, Franco ; Forlenza, Donato ; Kurtulik, Ray ; Chong, Wendy
Author_Institution
IBM Microelectron., Essex Junction, VT, USA
fYear
1998
fDate
18-23 Oct 1998
Firstpage
43
Lastpage
52
Abstract
SEMATECH has sponsored a “test method evaluation” study to understand the trade-offs among the most common test methodologies used in the industry. This paper presents the results of the failure analysis portion of that project. The testing, reliability stressing, characterization, fault diagnosis and physical analysis results are presented for 25 devices including “IDDq-only” failures and “delay test-only” failures
Keywords
delays; failure analysis; fault diagnosis; integrated circuit reliability; integrated circuit testing; IDDq; SEMATECH test; delay test; failure analysis; fault diagnosis; physical analysis; reliability; Analytical models; Fabrication; Failure analysis; Fault detection; Fault diagnosis; Logic testing; Manufacturing industries; Microelectronics; Optimization methods; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1998. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-5093-6
Type
conf
DOI
10.1109/TEST.1998.743135
Filename
743135
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