DocumentCode :
252410
Title :
Automatic classification of SMD packages using neural network
Author :
SeungGeun Youn ; YounAe Lee ; TaeHyung Park
Author_Institution :
Control & Robot Eng., Chungbuk Nat. Univ., Cheongju, South Korea
fYear :
2014
fDate :
13-15 Dec. 2014
Firstpage :
790
Lastpage :
795
Abstract :
This paper proposes a surface mount device (SMD) classification method for printed circuit board (PCB) assembly inspection machines. The package types of SMD components must be classified to create a job program for the inspection machine. In order to reduce the creation time of the job program, we developed an automatic classification algorithm for SMD packages. We identify the chip-type packages by color and edge distribution of images. The input images are transformed to the hue saturation intensity (HSI) color model, and the binarized histograms are extracted for the H and S spaces. Also the edges are extracted from the binarized image, and quantized histograms are obtained for the horizontal and vertical directions. A neural network is then applied to classify package types from the histogram inputs. Experimental results verify the usefulness of the proposed method.
Keywords :
automatic optical inspection; image colour analysis; neural nets; printed circuits; surface mount technology; AOI; H spaces; HSI color model; PCB assembly inspection machines; S spaces; SMD packages; automated optical inspection; automatic classification algorithm; binarized histograms; binarized image; chip-type packages; color distribution; edge distribution; horizontal directions; hue saturation intensity; job program; neural network; printed circuit board; quantized histograms; surface mount device; vertical directions; Biological neural networks; Histograms; Image color analysis; Image edge detection; Inspection; Resists; AOI (automatic inspection machine); PCB assembly; SMD package; image classification; neural networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
System Integration (SII), 2014 IEEE/SICE International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
978-1-4799-6942-5
Type :
conf
DOI :
10.1109/SII.2014.7028139
Filename :
7028139
Link To Document :
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