DocumentCode :
2524150
Title :
Markov random field models for supervised land cover classification from very high resolution multispectral remote sensing images
Author :
Moser, Gabriele ; Serpico, Sebastiano B. ; Benediktsson, Jon Atli
Author_Institution :
Dept. of Telecommun., Electron., Electr., & Naval Eng. (DITEN), Univ. of Genoa, Genoa, Italy
fYear :
2012
fDate :
12-14 Sept. 2012
Firstpage :
235
Lastpage :
242
Abstract :
One- and multidimensional Markov models represent a general family of stochastic models for the dependence properties associated with random sequences or random fields in many applications in the Information and Communication Technology (ICT) field, such as networking, automation, speech processing, genomic-sequence analysis, or image processing. Here, we focus on land cover mapping from very high-resolution remote-sensing images, which is an important problem in many environmental monitoring and natural resource management applications. In this framework, Markov random fields are of great importance. They allow the spatial information associated with image data to be described and effectively incorporated into image classification. The main ideas and previous work about Markov modeling for very high-resolution image classification are reviewed in the paper and processing results obtained through recent methods proposed by the authors are discussed.
Keywords :
Markov processes; geophysical image processing; image classification; image resolution; image sequences; remote sensing; ICT field; Markov random field models; dependence properties; environmental monitoring; genomic-sequence analysis; image classification; image data; image processing; information and communication technology field; land cover mapping; multidimensional Markov models; natural resource management applications; one-dimensional Markov models; random fields; random sequences; speech processing; supervised land cover classification; very high resolution multispectral remote sensing images; very high-resolution image classification; Accuracy; Feature extraction; Image edge detection; Materials; Remote sensing; Spatial resolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advances in Radar and Remote Sensing (TyWRRS), 2012 Tyrrhenian Workshop on
Conference_Location :
Naples
Print_ISBN :
978-1-4673-2443-4
Type :
conf
DOI :
10.1109/TyWRRS.2012.6381135
Filename :
6381135
Link To Document :
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