• DocumentCode
    2524520
  • Title

    Litton folded-waveguide high-power millimeter-wave TWTs

  • Author

    Lyon, D.B. ; Theiss, A.J.

  • Author_Institution
    Electron Devices Div., Litton Ind., San Carlos, CA, USA
  • fYear
    1994
  • fDate
    11-14 Dec. 1994
  • Firstpage
    918
  • Lastpage
    920
  • Abstract
    Summary form only given, as follows. Litton EDD is developing a new class of PPM-focused, narrowband, high average power, millimeter-wave TWTs that utilize a novel integral-polepiece folded-waveguide circuit. The first of these TWTs produced over 250 watts of average power at Ka-band despite construction errors that degraded tube performance. This paper describes the third of such tubes built and tested under Litton´s internal research and development program. This TWT is similar to that mentioned above in several ways. They both utilize 20 kV 0.75 A beams formed with a beam convergence of only 36 to minimize beam thermal effects. They both have gain levels of 10 dB/inch, bandwidths of about 350 MHz at Ka-band, and peak power levels between 800 and 1400 watts. However, additional development has resulted in significantly improved performance. By improving the beam optics, the DC transmission was raised above 99% and the minimum RF transmission raised above 98%. By increasing the depression of the single stage collector, the total efficiency was raised to values between 20% and 28%. By increasing the duty to 75%, average output powers were raised above one kilowatt. Specific test results are presented along with their impact on Litton´s development of a 250 watt average power W-band TWT.<>
  • Keywords
    electron beam focusing; electron optics; millimetre wave tubes; travelling wave tubes; waveguides; 0.75 A; 20 kV; 20 to 28 percent; 350 MHz; 800 to 1400 W; DC transmission; EHF; Ka-band; Litton; PPM-focused TWT; RF transmission; beam optics; folded-waveguide TWT; high-power MM-wave TWTs; integral-polepiece folded-waveguide circuit; millimeter-wave TWTs; narrowband operation; single stage collector depression; Bandwidth; Circuit testing; Convergence; Degradation; Millimeter wave circuits; Narrowband; Optical beams; Radio frequency; Research and development; Structural beams;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1994. IEDM '94. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-2111-1
  • Type

    conf

  • DOI
    10.1109/IEDM.1994.383264
  • Filename
    383264