DocumentCode
2524573
Title
Detection of abnormalities and electricity theft using genetic Support Vector Machines
Author
Nagi, J. ; Yap, K.S. ; Tiong, S.K. ; Ahmed, S.K. ; Mohammad, A.M.
fYear
2008
fDate
19-21 Nov. 2008
Firstpage
1
Lastpage
6
Abstract
Efficient methods for detecting electricity fraud has been an active research area in recent years. This paper presents a hybrid approach towards non-technical loss (NTL) analysis for electric utilities using genetic algorithm (GA) and support vector machine (SVM). The main motivation of this study is to assist Tenaga Nasional Berhad (TNB) in Malaysia to reduce its NTLs in the distribution sector. This hybrid GA-SVM model preselects suspected customers to be inspected onsite for fraud based on abnormal consumption behavior. The proposed approach uses customer load profile information to expose abnormal behavior that is known to be highly correlated with NTL activities. GA provides an increased convergence and globally optimized SVM hyper-parameters using a combination of random and prepopulated genomes. The result of the fraud detection model yields classified classes that are used to shortlist potential fraud suspects for onsite inspection. Simulation results prove the proposed method is more effective compared to the current actions taken by TNB in order to reduce NTL activities.
Keywords
genetic algorithms; inspection; power consumption; power engineering computing; support vector machines; Malaysia; SVM; Tenaga Nasional Berhad; abnormal consumption behavior; electricity theft; genetic algorithm; genetic support vector machines; hybrid GA-SVM model; nontechnical loss; onsite inspection; prepopulated genomes; shortlist potential fraud; Algorithm design and analysis; Biological cells; Convergence; Data mining; Genetic algorithms; Genomics; Inspection; Power industry; Support vector machine classification; Support vector machines; Support vector machine; electricity theft; genetic algorithm; load profile; non-technical loss;
fLanguage
English
Publisher
ieee
Conference_Titel
TENCON 2008 - 2008 IEEE Region 10 Conference
Conference_Location
Hyderabad
Print_ISBN
978-1-4244-2408-5
Electronic_ISBN
978-1-4244-2409-2
Type
conf
DOI
10.1109/TENCON.2008.4766403
Filename
4766403
Link To Document