Title :
Detection of abnormalities and electricity theft using genetic Support Vector Machines
Author :
Nagi, J. ; Yap, K.S. ; Tiong, S.K. ; Ahmed, S.K. ; Mohammad, A.M.
Abstract :
Efficient methods for detecting electricity fraud has been an active research area in recent years. This paper presents a hybrid approach towards non-technical loss (NTL) analysis for electric utilities using genetic algorithm (GA) and support vector machine (SVM). The main motivation of this study is to assist Tenaga Nasional Berhad (TNB) in Malaysia to reduce its NTLs in the distribution sector. This hybrid GA-SVM model preselects suspected customers to be inspected onsite for fraud based on abnormal consumption behavior. The proposed approach uses customer load profile information to expose abnormal behavior that is known to be highly correlated with NTL activities. GA provides an increased convergence and globally optimized SVM hyper-parameters using a combination of random and prepopulated genomes. The result of the fraud detection model yields classified classes that are used to shortlist potential fraud suspects for onsite inspection. Simulation results prove the proposed method is more effective compared to the current actions taken by TNB in order to reduce NTL activities.
Keywords :
genetic algorithms; inspection; power consumption; power engineering computing; support vector machines; Malaysia; SVM; Tenaga Nasional Berhad; abnormal consumption behavior; electricity theft; genetic algorithm; genetic support vector machines; hybrid GA-SVM model; nontechnical loss; onsite inspection; prepopulated genomes; shortlist potential fraud; Algorithm design and analysis; Biological cells; Convergence; Data mining; Genetic algorithms; Genomics; Inspection; Power industry; Support vector machine classification; Support vector machines; Support vector machine; electricity theft; genetic algorithm; load profile; non-technical loss;
Conference_Titel :
TENCON 2008 - 2008 IEEE Region 10 Conference
Conference_Location :
Hyderabad
Print_ISBN :
978-1-4244-2408-5
Electronic_ISBN :
978-1-4244-2409-2
DOI :
10.1109/TENCON.2008.4766403