DocumentCode
252460
Title
A novel BIST technique for LDMOS drivers
Author
Kim, Bumki ; Mondal, Sudipta ; Taenzler, Friedrich ; Moushegian, Kenneth
Author_Institution
Dept. of Electr. Eng., City Univ. of New York, New York, NY, USA
fYear
2014
fDate
3-6 Aug. 2014
Firstpage
1069
Lastpage
1072
Abstract
In this paper we describe a novel Built-in-Self-Test (BIST) method using a voltage comparator to detect gate-oxide and drain leakage current for LDMOS by applying a pulse test stimulus. A temperature calibration circuit was also designed for LDMOS-based motor drivers.
Keywords
MOSFET circuits; built-in self test; comparators (circuits); driver circuits; leakage currents; BIST technique; LDMOS drivers; LDMOS-based motor drivers; built-in-self-test method; gate-oxide detection; pulse test stimulus; temperature calibration circuit; voltage comparator; Built-in self-test; Leakage currents; Logic gates; Semiconductor device modeling; Temperature control; Temperature sensors; BIST; LDMOS; Self Calibration; Temperature Control;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (MWSCAS), 2014 IEEE 57th International Midwest Symposium on
Conference_Location
College Station, TX
ISSN
1548-3746
Print_ISBN
978-1-4799-4134-6
Type
conf
DOI
10.1109/MWSCAS.2014.6908603
Filename
6908603
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