DocumentCode
2524614
Title
Concepts and techniques for short optical pulse characterization
Author
Dorrer, C.
Author_Institution
Bell Laboratories-Lucent Technologies, 101 Crawfords Comer Road, Holmdel, NJ, 07733
fYear
2004
fDate
28-30 Sept. 2004
Firstpage
63
Lastpage
68
Abstract
The measurement of the electric field of short optical pulses is an active domain of research and development as many applications demand accurate characterization. Characterization techniques can be classified according to general concepts that condition their properties and implementation. The concepts of spectrography, interferometry and tomography are reviewed and examples of corresponding techniques are presented.
Keywords
Chirp; Delay; Electric variables measurement; Frequency measurement; Optical filters; Optical interferometry; Optical pulses; Pulse measurements; Spectrogram; Ultrafast optics;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical Fiber Measurements, 2004. Technical Digest: Symposium on
Conference_Location
Boulder, CO, USA
Print_ISBN
1-886843-37-6
Type
conf
DOI
10.1109/SOFM.2004.183476
Filename
1391929
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