Title :
Concepts and techniques for short optical pulse characterization
Author_Institution :
Bell Laboratories-Lucent Technologies, 101 Crawfords Comer Road, Holmdel, NJ, 07733
Abstract :
The measurement of the electric field of short optical pulses is an active domain of research and development as many applications demand accurate characterization. Characterization techniques can be classified according to general concepts that condition their properties and implementation. The concepts of spectrography, interferometry and tomography are reviewed and examples of corresponding techniques are presented.
Keywords :
Chirp; Delay; Electric variables measurement; Frequency measurement; Optical filters; Optical interferometry; Optical pulses; Pulse measurements; Spectrogram; Ultrafast optics;
Conference_Titel :
Optical Fiber Measurements, 2004. Technical Digest: Symposium on
Conference_Location :
Boulder, CO, USA
Print_ISBN :
1-886843-37-6
DOI :
10.1109/SOFM.2004.183476
