• DocumentCode
    2524705
  • Title

    Environmental stress effects on fiber optic cable end faces

  • Author

    Toney, J.E. ; Mazurowski, John

  • Author_Institution
    Electro-Opt. Center, Pennsylvania State Univ., Freeport, PA, USA
  • fYear
    2009
  • fDate
    22-24 Sept. 2009
  • Firstpage
    52
  • Lastpage
    53
  • Abstract
    The PC and PC-NC termini studied here showed tolerable changes in optical transmittance under temperature cycling, vibration testing or mating/de-mating cycles with periodic cleaning. The flat-NC termini studied here showed much greater average change, and much greater variability, from all stimuli than the other types. We hypothesize that this is due to variation in fiber height, and was in contrast to expected variations fiber height for the PC-NC termini as well. There are substantial differences between the designs of the PC-NC and the flat-NC termini which could cause the discrepancy: 1) end face shape, 2) very short fiber attachment region inside the flat-NC terminus, 3) possible inconsistent fiber coating adhesion, or 4) stress caused from use of tight buffered cable with the flat-NC terminus. Failure analysis did not detect epoxy failure. The mate/demate test results highlight the importance of regular cleaning to prevent end face damage.
  • Keywords
    adhesion; cleaning; life testing; optical cables; optical fibre cladding; optical fibre testing; end face damage prevention; environmental stress effects; fiber attachment region; fiber end face shape; fiber optic cable end faces; fiber optic interconnections; flat-noncontact termini; inconsistent fiber coating adhesion; mating-demating cycles; optical transmittance; periodic cleaning; physical contact-noncontact termini; temperature cycling; vibration testing; Cleaning; Coatings; Face detection; Optical buffering; Optical fiber cables; Optical fiber testing; Optical fibers; Shape; Stress; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Avionics, Fiber-Optics and Phototonics Technology Conference, 2009. AVFOP '09. IEEE
  • Conference_Location
    San Antonio, TX
  • Print_ISBN
    978-1-4244-3358-2
  • Type

    conf

  • DOI
    10.1109/AVFOP.2009.5342639
  • Filename
    5342639