DocumentCode :
252482
Title :
A 361nA thermal run-away immune VBB generator using dynamic substrate controlled charge pump for ultra low sleep current logic on 65nm SOTB
Author :
Nagatomi, H. ; Sugii, N. ; Kamohara, S. ; Ishibashi, K.
Author_Institution :
Univ. of Electro-Commun., Chofu, Japan
fYear :
2014
fDate :
6-9 Oct. 2014
Firstpage :
1
Lastpage :
2
Abstract :
This paper proposed an on-chip low power Body Bias Generator (VBBGEN) for ultra low leakage at 65nm SOTB (Silicon on Thin Buried Oxide) logic circuits at sleep mode. In the results of post layout simulation, the VBBGEN can generate and apply up to -2V body bias at a supply voltage of 0.5V with a current consumption of less than 361nA. By using the VBBGEN, it is expected that sleep current of CPU on SOTB is decreased by more than two orders of magnitude. In addition, the VBBGEN also has a function that prevents thermal run away of SOTB logic circuits.
Keywords :
charge pump circuits; integrated circuit design; integrated logic circuits; low-power electronics; silicon-on-insulator; SOTB logic circuits; current 361 nA; current consumption; dynamic substrate controlled charge pump; on-chip low power body bias generator; silicon-on-thin buried oxide logic circuits; size 65 nm; thermal run-away immune VBB generator; ultralow sleep current logic; voltage 0.5 V; Charge pumps; Generators; Layout; Logic circuits; Substrates; System-on-chip; Temperature; Body bias; Charge pump; Energy harvesting; Low leakage; SOTB;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2014 IEEE
Conference_Location :
Millbrae, CA
Type :
conf
DOI :
10.1109/S3S.2014.7028184
Filename :
7028184
Link To Document :
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