Title :
Toward robust subthreshold circuit design - Variability and soft error perspective
Author_Institution :
Dept. Inf. Syst. Eng., Osaka Univ., Suita, Japan
Abstract :
Subthreshold circuits are drawing attention for ultra-low power application. However, subthreshold circuits have inherent problems that their performance is extremely sensitive to manufacturing and environmental variability and they are susceptible to soft errors. This paper discusses robust subthreshold circuit design from variability and soft error perspective.
Keywords :
low-power electronics; network synthesis; radiation hardening (electronics); environmental variability; manufacturing; robust subthreshold circuit design; soft error perspective; ultra-low power application; variability perspective; Ions; Sensors;
Conference_Titel :
SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2014 IEEE
Conference_Location :
Millbrae, CA
DOI :
10.1109/S3S.2014.7028190