DocumentCode
252492
Title
Toward robust subthreshold circuit design - Variability and soft error perspective
Author
Hashimoto, M.
Author_Institution
Dept. Inf. Syst. Eng., Osaka Univ., Suita, Japan
fYear
2014
fDate
6-9 Oct. 2014
Firstpage
1
Lastpage
2
Abstract
Subthreshold circuits are drawing attention for ultra-low power application. However, subthreshold circuits have inherent problems that their performance is extremely sensitive to manufacturing and environmental variability and they are susceptible to soft errors. This paper discusses robust subthreshold circuit design from variability and soft error perspective.
Keywords
low-power electronics; network synthesis; radiation hardening (electronics); environmental variability; manufacturing; robust subthreshold circuit design; soft error perspective; ultra-low power application; variability perspective; Ions; Sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2014 IEEE
Conference_Location
Millbrae, CA
Type
conf
DOI
10.1109/S3S.2014.7028190
Filename
7028190
Link To Document