DocumentCode :
252492
Title :
Toward robust subthreshold circuit design - Variability and soft error perspective
Author :
Hashimoto, M.
Author_Institution :
Dept. Inf. Syst. Eng., Osaka Univ., Suita, Japan
fYear :
2014
fDate :
6-9 Oct. 2014
Firstpage :
1
Lastpage :
2
Abstract :
Subthreshold circuits are drawing attention for ultra-low power application. However, subthreshold circuits have inherent problems that their performance is extremely sensitive to manufacturing and environmental variability and they are susceptible to soft errors. This paper discusses robust subthreshold circuit design from variability and soft error perspective.
Keywords :
low-power electronics; network synthesis; radiation hardening (electronics); environmental variability; manufacturing; robust subthreshold circuit design; soft error perspective; ultra-low power application; variability perspective; Ions; Sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2014 IEEE
Conference_Location :
Millbrae, CA
Type :
conf
DOI :
10.1109/S3S.2014.7028190
Filename :
7028190
Link To Document :
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