• DocumentCode
    252492
  • Title

    Toward robust subthreshold circuit design - Variability and soft error perspective

  • Author

    Hashimoto, M.

  • Author_Institution
    Dept. Inf. Syst. Eng., Osaka Univ., Suita, Japan
  • fYear
    2014
  • fDate
    6-9 Oct. 2014
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Subthreshold circuits are drawing attention for ultra-low power application. However, subthreshold circuits have inherent problems that their performance is extremely sensitive to manufacturing and environmental variability and they are susceptible to soft errors. This paper discusses robust subthreshold circuit design from variability and soft error perspective.
  • Keywords
    low-power electronics; network synthesis; radiation hardening (electronics); environmental variability; manufacturing; robust subthreshold circuit design; soft error perspective; ultra-low power application; variability perspective; Ions; Sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2014 IEEE
  • Conference_Location
    Millbrae, CA
  • Type

    conf

  • DOI
    10.1109/S3S.2014.7028190
  • Filename
    7028190