Title :
Image denoising using wavelet transform
Author :
Ruikar, Sachin ; Doye, D.D.
Author_Institution :
Electron. & Telecommun. Dept., STES´´s Sinhgad Acad. of Engg, Pune, India
Abstract :
An image is often corrupted by noise in its acquisition and transmission. Removing noise from the original image is still a challenging problem for researchers. In this work new approach of threshold function developed for image denoising algorithms. It uses wavelet transform in connection with threshold functions for removing noise. Universal, Visu Shrink, Sure Shrink and Bayes Shrink, normal shrink are compared with our threshold function, it improves the SNR efficiently.
Keywords :
Bayes methods; image denoising; interference suppression; wavelet transforms; Bayes shrink; image denoising; noise removal; normal shrink; sure shrink; threshold function; visu shrink; wavelet transform; Complexity theory; Image coding; Noise reduction; baysshrink; etc; normalshrink; sureshrink; universashrink; vishushrink;
Conference_Titel :
Mechanical and Electrical Technology (ICMET), 2010 2nd International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-8100-2
Electronic_ISBN :
978-1-4244-8102-6
DOI :
10.1109/ICMET.2010.5598411
